Comparison of in-plane and out-of-plane optical amplification in AFM measurements
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چکیده
منابع مشابه
In-Plane and out of Plane Free Vibration of U-Shaped AFM Probes Based on the Nonlocal Elasticity
Atomic force microscope (AFM) has been developed at first for topography imaging; in addition, it is used for characterization of mechanical properties. Most researches have been primarily focused on rectangular single-beam probes to make vibration models simple. Recently, the U-shaped AFM probe is employed to determine sample elastic properties and has been developed to heat samples locally. I...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 2005
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.1878153